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| White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED* 1GB - 128Mx72 DDR SDRAM REGISTERED w/PLL, FBGA FEATURES Double-data-rate architecture DDR266 and DDR333 * JEDEC design specifications Bi-directional data strobes (DQS) Differential clock inputs (CK & CK#) Programmable Read Latency 2,2,5 (clock) Programmable Burst Length (2,4,8) Programmable Burst type (sequential & interleave) Edge aligned data output, center aligned data input Auto and self refresh Serial presence detect Power Supply: * VCC = VCCQ = +2.5V 0.2V (100, 133 and 166MHz) 184 pin DIMM package PCB height: * D3: 29.97mm (1.18") NOTE: Consult factory for availability of: * Lead-Free Products * Vendor source control options * Industrial temperature options * This product is under development, is not qualified or characterized and is subject to change or cancellation without notice. DESCRIPTION The WV3EG128M72EFSR is a 128Mx72 Double Data Rate SDRAM memory module based on 512Mb DDR SDRAM component. The module consists of eighteen 64Mx8 DDR components in FBGA packages mounted on a 184 Pin FR4 substrate. Synchronous design allows precise cycle control with the use of system clock. Data I/O transactions are possible on both edges and Burst Lenths allow the same device to be useful for a variety of high bandwidth, high performance memory system applications. OPERATING FREQUENCIES DDR333 @CL=2.5 Clock Speed CL-tRCD-tRP 166MHz 2.5-3-3 DDR266 @CL=2 133MHz 2-2-2 DDR266 @CL=2.5 133MHz 2.5-3-3 March 2005 Rev. 0 1 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED PIN CONFIGURATION PIN 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 SYMBOL VREF DQ0 VSS DQ1 DQS0 DQ2 VCC DQ3 NC RESET# VSS DQ8 DQ9 DQS1 VCCQ NC NC VSS DQ10 DQ11 CKE0 VCCQ DQ16 DQ17 DQS2 VSS A9 DQ18 A7 VCCQ DQ19 A5 DQ24 VSS DQ25 DQS3 A4 VCC DQ26 DQ27 A2 VSS A1 CB0 CB1 VCC PIN 47 48 49 50 51 52 53 54 55 56 57 56 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 SYMBOL DQS8 A0 CB2 VSS CB3 BA1 DQ32 VCCQ DQ33 DQS4 DQ34 VSS BA0 DQ35 DQ40 VCCQ WE# DQ41 CAS# VSS DQS5 DQ42 DQ43 VCC NC DQ48 DQ49 VSS NC NC VCCQ DQS6 DQ50 DQ51 VSS VCCID DQ56 DQ57 VCC DQS7 DQ58 DQ59 VSS NC SDA SCL PIN 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 SYMBOL VSS DQ4 DQ5 VCCQ DM0/DQS9 DQ6 DQ7 VSS NC NC NC VCCQ DQ12 DQ13 DM1/DQS10 VCC DQ14 DQ15 CKE1 VCCQ NC DQ20 A12 VSS DQ21 A11 DM2/DQS11 VCC DQ22 A8 DQ23 VSS A6 DQ28 DQ29 VCCQ DM3/DQS12 A3 DQ30 VSS DQ31 CB4 CB5 VCCQ CK0 CK0# PIN 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 SYMBOL VSS DM8/DQS17 A10 CB6 VCCQ CB7 VSS DQ36 DQ37 VCC DM4/DQS13 DQ38 DQ39 VSS DQ44 RAS# DQ45 VCCQ CS0# CS1# DM5/DQS14 VSS DQ46 DQ47 NC VCCQ DQ52 DQ53 NC VCC DM6/DQS15 DQ54 DQ55 VCCQ NC DQ60 DQ61 VSS DM7/DQS16 DQ62 DQ63 VCCQ SA0 SA1 SA2 VCCSPD PIN NAMES A0-A12 BA0-BA1 DQ0-DQ63 CB0-CB7 DQS0-DQS8 CK0 CK0# CKE0, CKE1 CS0#, CS1# RAS# CAS# DM0-DM8 WE# VCC VCCQ VSS VREF VCCSPD SDA SCL SA0-SA2 VCCID NC RESET# Address input (Multiplexed) Bank Select Address Data Input/Output Check bits Data Strobe Input/Output Clock Input Clock Input Clock Enable input Chip Select Input Row Address Strobe Column Address Strobe Data-in Mask Write Enable Power Supply Power Supply for DQS Ground Power Supply for Reference Serial EEPROM Power Supply Serial data I/O Serial clock Address in EEPROM VCC Indentification Flag No Connect Reset Enable March 2005 Rev. 0 2 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED FUNCTIONAL BLOCK DIAGRAM RCS0# DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS RCS1# DQS5 DM5/DQS14 DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS0 DM0/DQS9 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 DQS1 DM1/DQS10 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS6 DM6/DQS15 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS2 DM2/DQS11 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS7 DM6/DQS16 DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS3 DM3/DQS12 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS8 DM7/DQS17 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS DQS4 DM4/DQS13 CB0 CB1 CB2 CB3 CB4 CB5 CB6 CB7 DM I/O7 I/O6 I/O1 I/O0 I/O5 I/O4 I/O3 I/O2 CS# DQS DM I/O0 I/O1 I/O6 I/O7 I/O2 I/O3 I/O4 I/O5 CS# DQS 120 CK0 CK0# PLL SERIAL PD CS0# CS1# BA0-BA1 A0-A12 RAS# CAS# CKE0 CKE1 WE# PCK PCK# R E G I S T E R RCS0# RCS1# RBA0-RBA1 RA0-RA12 RRAS# RCAS# RCKE0 RCKE1 RWE# RESET# SCL WP BA0-BA1: SDRAMs A0-A12: SDRAMs RAS#: SDRAMs CAS#: SDRAMs CKE: SDRAMs CKE: SDRAMs WE#: DQRAMs SDA A0 A1 A2 SA0 SA1 SA2 DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM DDR SDRAM REGISTER X 2 VCCSPD VCCQ VCC VREF VSS SPD DDR SDRAMS DDR SDRAMS DDR SDRAMS DDR SDRAMS Note: All resistor values are 22 unless otherwise indicated. March 2005 Rev. 0 3 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs Parameter Voltage on any pin relative to VSS Voltage on VCC supply relative to VSS Storage Temperature Power Dissipation Short Circuit Current Note: WV3EG128M72EFSR-D3 ADVANCED ABSOLUTE MAXIMUM RATINGS Symbol VIN, VOUT VCC, VCCQ TSTG PD IOS Value -0.5 to 3.6 -1.0 to 3.6 -55 to +150 18 50 Units V V C W mA Permanent device damage may occur if `ABSOLUTE MAXIMUM RATINGS' are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability DC CHARACTERISTICS 0C TA 70C, VCC = 2.5V 0.2V Symbol VCC VCCQ VREF VTT VIH(DC) VIL(DC) VIN(DC) VID(DC) VIX(DC) IL IOZ IOH IOL IOH IOL 4. Parameter Supply Voltage (for device with nominal VCC of 2.5V) I/O Supply Voltage I/O Reference Voltage I/O Termination Voltage (systems) Input Logic High Voltage Input Logic Low Voltage Input Voltage Level, CK and CK# inputs Input Differential Voltage, CK and CK# inputs Input Crossing Point Voltage, CK and CK# inputs Input Leakage Current Output Leakage Current Output High Current (Normal strength driver); VOUT = VTT + 0.84V Output High Current (Normal strength driver); VOUT = VTT - 0.84V Output High Current (Half strength driver); VOUT = VTT + 0.45V Output High Current (Half strength driver); VOUT = VTT - 0.45V Notes: 1. Includes 25mV margin for DC offset on VREF, and a combined total of 50mV margin for all AC noise and DC offset on VREF, bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on VREF and internal DRAM noise coupled TO VREF, both of which may result in VREF noise. VREF should be de-coupled with an inductance of 3nH. 2. VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF, and must track variations in the DC level of VREF 3. VID is the magnitude of the difference between the input level on CK and the input level on CK#. Min 2.3 2.3 VCCQ/2-50mV VREF -0.04 VREF +0.15 -0.3 -0.3 0.3 1.15 -2 -5 -16.8 16.8 -9 9 Max 2.3 2.3 VCCQ/2+50mV VREF +0.04 VCCQ +0.3 VREF -0.15 VCCQ +0.3 VCCQ +0.6 1.35 2 5 Unit V V V V V V V V V uA uA mA mA mA mA 5. 6. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in simulation. The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ. The value of VIX is expected to equal 0.5*VCCQ of the transmitting device and must track variations in the dc level of the same. These charactericteristics obey the SSTL-2 class II standards. CAPACITANCE Symbol CIN1 CIN2 CIN3 CIN4 CIN5 CIN6 CIN7 COUT COUT 4 TA = 25C. f = 1MHz, VCC = 2.5V Parameter Input Capacitance (A0-A12) Input Capacitance (RAS#, CAS#, WE#) Input Capacitance (CKE0, CKE1) Input Capacitance (CK0#, CK0) Input Capacitance (CS0#, CS1#) Input Capacitance (DQM0-DQM8) Input Capacitance (BA0-BA1) Data input/output capacitance (DQ0-DQ63)(DQS) Data input/output capacitance (CB0-CB7) March 2005 Rev. 0 Max 11 11 11 12 11 15 11 15 15 Unit pF pF pF pF pF pF pF pF pF White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED Recommended operating conditions, 0C TA 70C, VCCQ = 2.5V 0.2V, VCC = 2.5V 0.2V Includes DDR SDRAM component only DDR333@ CL=2.5 Max 4140 DDR266@ CL=2 Max 4140 DDR266@ CL=2.5 Max 4140 IDD SPECIFICATIONS AND TEST CONDITIONS Parameter Operating Current Symbol IDD0 Conditions One device bank; Active - Precharge; tRC=tRC (MIN); tCK=tCK (MIN); DQ,DM and DQS inputs changing once per clock cycle; Address and control inputs changing once every two cycles. One device bank; Active-Read-Precharge Burst = 2; tRC=tRC (MIN); tCK=tCK (MIN); lOUT = 0mA; Address and control inputs changing once per clock cycle. All device banks idle; Power-down mode; tCK=tCK (MIN); CKE=(low) CS# = High; All device banks idle; tCK=tCK (MIN); CKE = high; Address and other control inputs changing once per clock cycle. VIN = VREF for DQ, DQS and DM. One device bank active; Power-Down mode; tCK (MIN); CKE=(low) CS# = High; CKE = High; One device bank; ActivePrecharge; tRC=tRAS (MAX); tCK=tCK (MIN); DQ, DM and DQS inputs changing twice per clock cycle; Address and other control inputs changing once per clock cycle. Burst = 2; Reads; Continuous burst; One device bank active; Address and control inputs changing once per clock cycle; TCK= TCK (MIN); lOUT = 0mA. Burst = 2; Writes; Continuous burst; One device bank active; Address and control inputs changing once per clock cycle; tCK=tCK (MIN); DQ,DM and DQS inputs changing once per clock cycle. tRC = tRC (MIN) CKE 0.2V Four bank interleaving Reads (BL=4) with auto precharge with tRC=tRC (MIN); tCK=tCK (MIN); Address and control inputs change only during Active Read or Write commands. Units mA Operating Current IDD1 4680 4680 4680 mA Precharge PowerDown Standby Current Idle Standby Current IDD2P IDD2F 180 1620 180 1620 180 1620 rnA mA Active Power-Down Standby Current Active Standby Current IDD3P IDD3N 1260 1800 1260 1800 1260 1800 mA mA Operating Current IDD4R 4770 4770 4770 mA Operating Current IDD4W 4590 4590 4590 rnA Auto Refresh Current Self Refresh Current Operating Current IDD5 IDD6 IDD7A 7020 180 9090 7020 180 9000 7020 180 9000 mA mA mA March 2005 Rev. 0 5 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED Recommended operating conditions, 0C TA 70C, VCCQ = 2.5V 0.2V, VCC = 2.5V 0.2V Includes PLL and register power DDR333@ CL=2.5 Max 4725 DDR266@ CL=2 Max 4725 DDR266@ CL=2.5 Max 4725 IDD SPECIFICATIONS AND TEST CONDITIONS Parameter Operating Current Symbol IDD0 Conditions One device bank; Active - Precharge; tRC=tRC (MIN); tCK=tCK (MIN); DQ,DM and DQS inputs changing once per clock cycle; Address and control inputs changing once every two cycles. One device bank; Active-Read-Precharge Burst = 2; tRC=tRC (MIN); tCK=tCK (MIN); lOUT = 0mA; Address and control inputs changing once per clock cycle. All device banks idle; Power-down mode; tCK=tCK (MIN); CKE=(low) CS# = High; All device banks idle; tCK=tCK (MIN); CKE = high; Address and other control inputs changing once per clock cycle. VIN = VREF for DQ, DQS and DM. One device bank active; Power-Down mode; tCK (MIN); CKE=(low) CS# = High; CKE = High; One device bank; ActivePrecharge; tRC=tRAS (MAX); tCK=tCK (MIN); DQ, DM and DQS inputs changing twice per clock cycle; Address and other control inputs changing once per clock cycle. Burst = 2; Reads; Continuous burst; One device bank active; Address and control inputs changing once per clock cycle; TCK= TCK (MIN); lOUT = 0mA. Burst = 2; Writes; Continuous burst; One device bank active; Address and control inputs changing once per clock cycle; tCK=tCK (MIN); DQ,DM and DQS inputs changing once per clock cycle. tRC = tRC (MIN) CKE 0.2V Four bank interleaving Reads (BL=4) with auto precharge with tRC=tRC (MIN); tCK=tCK (MIN); Address and control inputs change only during Active Read or Write commands. Units mA Operating Current IDD1 5265 5265 5265 mA Precharge PowerDown Standby Current Idle Standby Current IDD2P IDD2F 180 1930 180 1930 180 1930 rnA mA Active Power-Down Standby Current Active Standby Current IDD3P IDD3N 1260 2110 1260 2110 1260 2110 mA mA Operating Current IDD4R 5355 5355 5355 mA Operating Current IDD4W 5535 5175 5175 rnA Auto Refresh Current Self Refresh Current Operating Current IDD5 IDD6 IDD7A 7640 455 9675 7605 455 9585 7605 455 9585 mA mA mA March 2005 Rev. 0 6 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED DETAILED TEST CONDITIONS FOR DDR SDRAM IDD1 & IDD7A IDD1 : OPERATING CURRENT : ONE BANK 1. 2. 3. Typical Case : VCC=2.5V, T=25C Worst Case : VCC=2.7V, T=10C Only one bank is accessed with tRC (min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle. IOUT = 0mA Timing Patterns : * DDR200 (100 MHz, CL=2) : tCK=10ns, CL2, BL=4, tRCD=2*tCK, tRAS=5*tCK Read : A0 N R0 N N P0 N A0 N - repeat the same timing with random address changing; 50% of data changing at every burst DDR266 (133MHz, CL=2.5) : tCK=7.5ns, CL=2.5, BL=4, tRCD=3*tCK, tRC=9*tCK, tRAS=5*tCK Read : A0 N N R0 N P0 N N N A0 N - repeat the same timing with random address changing; 50% of data changing at every burst DDR266 (133MHz, CL=2) : tCK=7.5ns, CL=2, BL=4, tRCD=3*tCK, tRC=9*tCK, tRAS=5*tCK Read : A0 N N R0 N P0 N N N A0 N - repeat the same timing with random address changing; 50% of data changing at every burst DDR333 (166MHz, CL=2.5) : tCK=6ns, BL=4, tRCD=10*tCK, tRAS=7*tCK Read : A0 N N R0 N P0 N N N A0 N - repeat the same timing with random address changing; 50% of data changing at every burst * IDD7A : OPERATING CURRENT : FOUR BANKS 1. 2. 3. Typical Case : VCC=2.5V, T=25C Worst Case : VCC=2.7V, T=10C Four banks are being interleaved with tRC (min), Burst Mode, Address and Control inputs on NOP edge are not changing. Iout=0mA Timing Patterns : * DDR200 (100 MHz, CL=2) : tCK=10ns, CL2, BL=4, tRRD=2*tCK, tRCD=3*tCK, Read with Autoprecharge Read : A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0 - repeat the same timing with random address changing; 100% of data changing at every burst DDR266 (133MHz, CL=2.5) : tCK=7.5ns, CL=2.5, BL=4, tRRD=3*tCK, tRCD=3*tCK Read with Autoprecharge Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing; 100% of data changing at every burst DDR266 (133MHz, CL=2) : tCK=7.5ns, CL2=2, BL=4, tRRD=2*tCK, tRCD=2*tCK Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing; 100% of data changing at every burst DDR333 (166MHz, CL=2.5) : tCK=6ns, BL=4, tRRD=3*tCK, tRCD=3*tCK, Read with Autoprecharge Read : A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1 R0 - repeat the same timing with random address changing; 100% of data changing at every burst 4. 4. * * * * * Legend: A = Activate, R = Read, W = Write, P = Precharge, N = NOP A (0-3) = Activate Bank 0-3 R (0-3) = Read Bank 0-3 March 2005 Rev. 0 7 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS 0C TA +70C; VCC = +2.5V 0.2V, VCCQ = +2.5V 0.2V AC Characteristics Parameter Access window of DQs from CK, CK# CK high-level width CK low-level width Clock cycle time CL=3 CL=2.5 CL=2 DQ and DM input hold time relative to DQS DQ and DM input setup time relative to DQS DQ and DM input pulse width (for each input) Access window of DQS from CK, CK# DQS input high pulse width DQS input low pulse width DQS-DQ skew, DQS to last DQ valid, per group, per access Write command to first DQS latching transition DQS falling edge to CK rising - setup time DQS falling edge from CK rising - hold time Half clock period Data-out high-impedance window from CK, CK# Data-out low-impedance window from CK, CK# Address and control input hold time (fast slew rate) Address and control input set-up time (fast slew rate) Address and control input hold time (slow slew rate) Address and control input setup time (slow slew rate) Address and control input pulse width (for each input) LOAD MODE REGISTER command cycle time DQ-DQS hold, DQS to first DQ to go non-valid, per access Data hold skew factor ACTIVE to PRECHARGE command ACTIVE to READ with Auto precharge command ACTIVE to ACTIVE/AUTO REFRESH command period AUTO REFRESH command period Symbol tAC tCH tCL tCK (3) tCK (2.5) tCK (2) tDH tDS tDIPW tDQSCK tDQSH tDQSL tDQSQ tDQSS tDSS tDSH tHP tHZ tLZ tIHf tISf tIHs tISs tIPW tMRD tQH tQHS tRAS tRAP tRC tRFC 42 18 60 72 -0.7 0.75 0.75 0.8 0.8 2.2 12 tHP-tQHS 0.55 70,000 45 15 60 75 0.75 0.2 0.2 tCH, tCL +0.7 -0.75 0.90 0.90 1 1 2.2 15 tHP-tQHS 0.75 120,000 45 20 65 75 Min -0.7 0.45 0.45 6 6 7.5 0.45 0.45 1.75 -0.6 0.35 0.35 0.4 1.25 0.75 0.2 0.2 tCH, tCL +0.75 -0.75 0.90 0.90 1 1 2.2 15 tHP-tQHS 0.75 120,000 +0.6 335 Max +0.7 0.55 0.55 13 12 12 Min -0.75 0.45 0.45 7.5 7.5 7.5 0.5 0.5 1.75 -0.75 0.35 0.35 0.5 1.25 0.75 0.2 0.2 tCH, tCL +0.75 +0.75 262 Max +0.75 0.55 0.55 13 12 12 Min -0.75 0.45 0.45 7.5 7.5 10 0.5 0.5 1.75 -0.75 0.35 0.35 0.5 1.25 +0.75 265 Max +0.75 0.55 0.55 13 12 12 Units ns tCK tCK ns ns ns ns ns ns ns tCK tCK ns tCK tCK tCK ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 21 15 13,14 18 8,19 8,20 6 6 6 6 13,14 16 16 22 22 22 14,17 14,17 17 Notes March 2005 Rev. 0 8 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS (continued) Notes 1-5, 7; notes appear following parameter tables; 0C TA +70C; VCC = +2.5V 0.2V, VCCQ = +2.5V 0.2V AC Characteristics Parameter ACTIVE to READ or WRITE delay PRECHARGE command period DQS read preamble DQS read postamble ACTIVE bank a to ACTIVE bank b command DQS write preamble DQS write preamble setup time DQS write postamble Write recovery time Internal WRITE to READ command delay Average periodic refresh interval Exit SELF REFRESH to non-READ command Exit SELF REFRESH to READ command Symbol tRCD tRP tRPRE tRPST tRRD tWPRE tWPRES tWPST tWR tWTR tREFI tXSNR tXSRD 75 200 Min 18 18 0.9 0.4 12 0.25 0 0.4 15 1 7.8 75 200 0.6 1.1 0.6 335 Max Min 20 20 0.9 0.4 15 0.25 0 0.4 15 1 7.8 75 200 0.6 1.1 0.6 262 Max Min 20 20 0.9 0.4 15 0.25 0 0.4 15 1 7.8 0.6 1.1 0.6 265 Max Units ns ns tCK tCK ns tCK ns tCK ns tCK s ns tCK 12 10,11 9 19 Notes March 2005 Rev. 0 9 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs Notes 1. 2. All voltages referenced to VSS Tests for AC timing, IDD, and electrical AC and DC characteristics may be conducted at normal reference / supply voltage levels, but the related specifications and device operations are guaranteed for the full voltage range specified. Outputs are measured with equivalent load: 13. 12. WV3EG128M72EFSR-D3 ADVANCED The refresh period is 64ms. This equates to an average refresh rate of 15.625s (256Mb component) or 7.8125s (512 Mb component). However, an AUTO REFRESH command must be asserted at least once every 140.6s (256 Mb component) or 70.3s (512Mb component); burst refreshing or posting by the DRAM controller greater than eight refresh cycles is not allowed. The valid data window is derived by achieving other specifications - tHP (tCK/2), tDQSQ, and tQH (tQH = tHP - tQHS). The data valid window derates directly proportional with the clock duty cycle and a practical data valid window can be derived. The clock is allowed a maximum duty cycled variation of 45/55. Functionality is uncertain when operating beyond a 45/55 ratio. The data valid window derating curves are provided below for duty cycles ranging between 50/50 and 45/55. Referenced to each output group: x4 = DQS with DQ0-DQ4. READs and WRITEs with auto precharge are not allowed to be issued until tRAS (MIN) can be satisfied prior to the internal precharge command being issued. JEDEC specifies CK and CK# input slew rate must be > 1V/ns (2V/ns differentially). DQ and DM input slew rates must not deviate from DQS by more than 10%. If the DQ/DM/DQS slew rate is less than 0.5V/ns, timing must be derated: 50ps must be added to tDS and tDH for each 100mV/ns reduction in slew rate. If slew rates exceed 4V/ns, functionality is uncertain. tHP min is the lesser of tCL min and tCH min actually applied to the device CK and CK# inputs, collectively during bank active. This maximum value is derived from the referenced test load. In practice, the values obtained in a typical terminated design may reflect up to 310ps less for tHZ (MAX) and last DVW. tHZ (MAX) will prevail over the tDQSCK (MAX) + tRPST (MAX) condition. tLZ (MIN) will prevail over tDQSCK (MIN) + PRE (MAX) condition. For slew rates greater than 1V/ns the (LZ) transition will start about 310ps earlier. CKE must be active (High) during the entire time a refresh command is executed. That is, from the time the AUTO REFRESH command is registered, CKE must be active at each rising clock edge, until tREF later. Whenever the operating frequency is altered, not including jitter, the DLL is required to be reset. This is followed by 200 clock cycles (before READ commands). 3. TT VTT Output (VOUT (VOUT) 50 50 Reference Point 30pF 14. 15. 4. AC timing and IDD tests may use a VIL-to-VIH swing of up to 1.5V in the test environment, but input timing is still referenced to VREF (or to the crossing point for CK/CK#), and parameter specifications are guaranteed for the specified AC input levels under normal use conditions. The minimum slew rate for the input signals used to test the device is 1V/ns in the range between VIL(AC) and VIH(AC). The AC and DC input level specifications are defined in the SSTL_ 2 standard (i.e., the receiver will effectively switch as a result of the signal crossing the AC input level, and will remain in that state as long as the signal does not ring back above [below] the DC input LOW [high] level). Command/Address input slew rate = 0.5V/ns. For -75 with slew rates 1V/ns and faster, tIS and tIH are reduced to 900ps. If the slew rate is less than 0.5V/ns, timing must be derated: tIS has an additional 50ps per each 100mV/ns reduction in slew rate from the 500mV/ns. tIH has 0ps added, that is, it remains constant. If the slew rate exceeds 4.5V/ns, functionality is uncertain. Inputs are not recognized as valid until VREF stabilizes. Exception: during the period before VREF stabilizes, CKE 0.3 x VCCQ is recognized as LOW. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referenced to a specific voltage level, but specify when the device output is no longer driving (HZ) and begins driving (LZ). The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but system performance (bus turnaround) will degrade accordingly. This is not a device limit. The device will operate with a negative value, but system performance could be degraded due to bus turnaround. It is recommended that DQS be valid (HIGH or LOW) on or before the WRITE command. The case shown (DQS going from High-Z to logic LOW) applies when no WRITEs were previously in progress on the bus. If a previous WRITE was in progress, DQS could be high during this time, depending on tDQSS. 16. 17. 5. 18. 19. 6. 7. 20. 21. 8. 22. 9. 10. 11. March 2005 Rev. 0 10 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED ORDERING INFORMATION FOR D3 Part Number WV3EG128M72EFSR335D3 WV3EG128M72EFSR262D3 WV3EG128M72EFSR265D3 NOTES: * Consult Factory for availability of Lead-Free products. (F = Lead-Free, G = RoHS Compliant) * Vendor specific part numbers are used to provide memory components source control. The place holder for this is shown as lower case "x" in the part numbers above and is to be replaced with the respective vendors code. Consult factory for qualified sourcing options. (M = Micron, S = Samsung & consult factory for others) * Consult factory for availability of industrial temperature (-40C to 85C) option Speed 166MHz/333Mb/s 133MHz/266Mb/s 133MHz/266Mb/s CAS Latency 2.5 2 2.5 tRCD 3 2 3 tRP 3 2 3 Height* 29.97 (1.18") 29.97 (1.18") 29.97 (1.18") PACKAGE DIMENSIONS FOR D3 133.35 (5.25) 128.95 (5.076) 2x 3.00 (2x 0.118) 4x 4.00+/-0.1 (4x 0.157+/-0.004) 19.80 (0.779) 29.97 0.15 (1.18 0.006) March 2005 Rev. 0 1.27 +/-0.1 (0.05+/-0.004) 12.00 (0.472) 2x DIA. 2.50 +0.1/-0.00 (2x DIA 0.098 + 0.004/-0.00) 1 6.35 (0.25) 2.175 (0.085) 3.80 (0.149) 6.35 (0.25) 4.175 (0.164) 1.80 (0.070) 1.0 0.05 (0.039 0.002) 10.00 (0.393) 92 1.27 (0.05) 49.53 (1.95) 0.20 0.15 (0.008 0.006) 2.50 (0.098) 3.99 MAX (0.157 MAX) 64.77 (2.55) 120.65 (4.75) 93 184 * ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES) 11 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs WV3EG128M72EFSR-D3 ADVANCED PART NUMBERING GUIDE WV 3 E G 128M 72 E F S R xxx D3 x F/G WEDC MEMORY DDR GOLD DEPTH BUS WIDTH x8 FBGA 2.5V REGISTERED SPEED (MHz) PACKAGE 184 PIN COMPONENT VENDOR NAME (M = Micron) (S = Samsung) F = LEAD-FREE, G = ROHS COMPLIANT March 2005 Rev. 0 12 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com White Electronic Designs Document Title 1GB - 128Mx72 DDR SDRAM REGISTERED w/PLL, FBGA WV3EG128M72EFSR-D3 ADVANCED Revision History Rev # Rev 0 History Created Release Date 3-05 Status Advanced March 2005 Rev. 0 13 White Electronic Designs Corporation * (602) 437-1520 * www.wedc.com |
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